DFY of XtalCIkChip: design for yield of trimming-free crystal-free precision reference clock oscillator IC chip

ABSTRACT

A Design For Yield (DFY) of Crystal Chip (XtalChip) is to have the high yield of high quality high accurate clock chip to be able to integrated in the SOC environment to save the production cost and board space, etc. The LC oscillation (LCO) tank has the constant oscillation amplitude control, constant oscillation common mode voltage, and inductor parametric resistance compensation over temperature and oscillation glitch filter capacitors.

This is a Continuation in Part application claims priority of U.S. patent application Ser. No. 11/500,125, filed Aug. 5, 2006, which herein incorporated by reference in its entirety.

BACKGROUND FIELD OF INVENTION

Design For Yield (DFY) is design to increase the yield in the real production chip. In the real chip, it is very complicated system. On the chip, there is a lot of noise. The circuit is not only designed for the silent solid power and ground but also has to work in the dynamic noisy environment.

Before, we have a large board, small chips and low ramping signal in the slow signal process. We can assume solid power and ground on the board and all the noise is dumped onto the board. Now, we have a tiny board, the giant SOC chips and the fast rising and falling signal in the signal process. We can no more assume the solid power and ground on the board and have all the noise been dumped onto the board. The chip and board are very noisy. However, today's analog front end (AFE) design is sill based on the “implicit assumptions” of the old-time design style. The AFE have very poor performance in such a noisy environment. The traditional AFE design is the army style circuit design. The earth is solid and not moving. Today analog circuit on SOC chip is the navy style circuit. The sea oscillates and vibrates violently. So, all the AFE sub-modules work individually. However, as they are put together on the SOC chip, the analog circuit does not work properly. The board is very noisy. All the digital noise is leaked to the tiny board.

The original definition of mixed signal simulation=analog (SPICE)+digital (Verilog). However, the mixed signal analog circuit has to survive in the noisy SOC environment. So, based on the SOC design discipline, the design for yield (DFY) has the analog/mixed signal/RF unified platform. The design methodology is developed to be unified design platform for the analog/mixed signal/RF design. Based on the whole chip/board simulator, the test bench for AFE has been developed successfully. The XtalChip is the chip having the most challenging requirements of all the chips. Based on DFY design and the whole chip/board simulator, the test bench for XtalChip has been developed successfully.

Both the XtalChip and XtalClkChip are the trademarks of Tang System. The XtalClkChip is the dream to replace the Crystal on the board and clock circuits in the chip with the XtalChip. Furthermore, the XtalChip can be integrated with the chip to be SOC (System On Chip). The XtalChip integrated with the clock system which comprising PLL, etc to be the XtalClkChip. However, from the system view, the XtalChip and XtalClkChip have the common resources which can be shared with each other. If the XtalClkChip has the direct access to the interior structure of the XtalChip, then the system integration will be much more realistic.

With the combination of the monolithic above-IC resonator bulk acoustic wave BAW VCO and fractional-N frequency synthesizer with randomized multiphase VCO, we have the XtalClkChip. The XtalClkChip is Trimming-Free Crystal-Free Precision Reference Clock Oscillator IC chip.

Unlike the RF LC clock generator in the prior arts, the XtalClkChip doesn't need to trim the bandgap voltage, flat current, capacitor in the LC tank, etc. The bandgap voltage and current vary nonlinear; capacitor varies nonlinear; inductor varies nonlinear. So many nonlinear factors work and combine together, it is impossible to use the trimming to have the compensation to be constant clock frequency.

The XtalClkChip will generate the customer's clocks directly. So, it might consider the XtalClkChip without the dividers to divide the LC tank down. Instead of dividing the LC tank down, the LC tank directly converts to the customer's clocks. From the system view point, our system saves the dividing process and eliminates the noise in the dividing process. Furthermore, the customer saves the PLL. The XtalClkChip is to get rid of the Crystal, crystal clock circuit and the PLL circuit with the high frequency direct conversion to other frequencies without the dividing the high frequency oscillation to low frequency clock.

BACKGROUND—DESCRIPTION OF PRIOR ART

Recently, there are some industrial activities which are what we said XtalChip. They used the LC tank to generate the 1 GHz oscillation first. Then divided the 1 GHz oscillation 40 times with a series of divide-by-2 dividers. Their argument is that the phase noises will be less in the dividing process. However, this argument is not true. It violates the communication theory. In fact, the phase noise does accumulate in the dividing process. The fact is that they have to use the synchronize circuit to re-sample the divided clock 24 MHz with the 1 GHz oscillation to reduce the phase noise in the divided clock 24 MHz. Since the re-sample of the fclk with the f_(o) oscillation of the LC tank signal, the output clock fclk must be the integer number of the f_(o) of the LC tank. They cannot generate the customer's specified clock frequency.

Furthermore, to keep the output clock to be constant over the variation of the temperature, voltage, process and aging, they have a lot of trimming resistors, capacitors, etc in the bandgap voltage reference, current reference, LCO oscillator, etc. To calibrate the chip and have the correct trimming values to store in the on-chip NVM (Non Volatile Memory), it costs a lot of resources in the calibration and test.

They don't use the PLL circuit. Their argument is the PLL introducing a lot of phase noise to the clock. So, they don't have the capability to adjust the final clock frequency. As the LC tank does not oscillate at the specified f_(o), they cannot adjust the final output clock at all. Especially, they used the on-chip inductors. The L and C values of the on-chip LC tank are extremely difficult to control. It is easily out of 20% deviation from the original designed oscillation. It is impossible for them to tune the offset resonant frequency back to the original designed output clock frequency range.

Since they don't use PLL, they cannot have the fractional −N capability to meet the different output clock frequency requirement. Even if their chip can have the constant frequency f_(o), however, they still cannot have the different output frequency fclk for different customers.

Furthermore, the FCC requires the spread spectrum of the output clock. Since in their design, the only frequency tuner is at their LC tank to change the spread spectrum. Now, the 10 KHz variance of the 1 GHz LC tank signal, 1 G/10 K=100000=17 bits accuracy. It has to use the varactor capacitance to vary with 17 bits accuracy. However, for the passive component accuracy limit is about 14 bits accuracy. So, it is impossible for the prior art which modulates the LC tank frequency to have the spread spectrum capability.

The RF LC clock generator in prior art adopts the trimming method to trim the bandgap voltage, flat current, capacitor in the LC tank, etc. However, the bandgap voltage and current vary nonlinear; capacitor varies nonlinear; inductor varies nonlinear. So many nonlinear factors work and combine together, it is impossible to use the trimming to have the compensation to be constant clock frequency.

The prior art cannot generate the custom's clock directly. The prior has to divide the oscillation LC tank down to low frequency, then the customer has to boost up the i frequency to high frequency with PLL. So, even the prior art claims that they don't have the PLL, however, they push the headache and burden to the user and customer's side. For the whole system, it still has PLLs. However, the customer has to take the responsibility to develop their own PLLs to boost up the frequency to the high frequencies.

So, the prior art hides a lot true facts from the customer. It is not a practical approach at all.

OBJECTS AND ADVANTAGES

The DFY XtalClkChip is the trimming-free crystal-free precision reference clock oscillator IC chip. Without any trimming, the XtalClkChip can provide the customer-specific reference clock and application-specific clocks to the customer. It saves the customer's crystal, crystal circuit and PLLs circuit.

From low end to high end DFY XtalClkChips, the inductor can be bonding wire, on-chip inductors, gyrator and BAW, etc.

In the DFY XtalClkChip design, the most advanced DFY circuit design methodology of the hierarchical circuit design is applied to the noise design discipline of the DFY circuit design. With the distributed embedded LDVRs, all the modules of the XtalClkChip are isolated from each other that the LCO pulling is minimized. The external disturbance of the LCO is minimized that the LCO frequency is crystal clean.

Furthermore, the DFY XtalClkChip can be integrated as IP that the external crystal and pins are completely eliminated. It increases the system performance and reduces the system cost.

DRAWING FIGURES

FIG. 1 is the block diagram of the DFY Trimming-Free Crystal-Free Precision Reference Clock Oscillator IC chip.

FIG. 2 is the calibration flow of the DFY XtalClkChip.

FIG. 3 is the off-chip capacitor and filter or inductor; (A) is the external capacitor and filter or inductor; (B) is the equivalent circuit of FIG. 3A; (C) is the on-chip capacitor, bonding-capacitor, and BAW filter or inductor; (D) is the cross-section of the BAW; (E) is the fringe-capacitor; (F) is the bonding-capacitor.

FIG. 4 is the block diagram of the multi-phase fractional-PLL.

FIG. 5 (A) is the inductor made of the gyrator and capacitor; (B) is the inductors made of the bonding wires; (C) is the schematics of the LCO made of the inductors of bonding wires.

FIG. 6 (A) is the schematic of the bandgap reference voltage V_(bg) and the bandgap reference current I_(bg); (B) is the global and local partition of the hierarchical circuit design in the frequency domain; (C) is the noise design with the PSRR in the hierarchical circuit design.

FIG. 7 (A) is the V_(bg), V_(ptat) and V_(ctat) graphical relation; (B) is the I_(bg), I_(ptat) and I_(ctat) graphical relation.

FIG. 8 (A) is the voltage compensation resistor unit; (B) is the temperature and voltage compensation of resistor with the ratio of two resistor applying to the programmable gain amplifier.

FIG. 9 is the block diagram of the DFY XtalClkChip with the IQ oscillators to enhance the Q factor of the oscillator tank and having the quadratic phase clock for the multi-phase fractional PLL.

FIG. 10 is the block diagram of the DFY XtalClkChip with the dual LCO having the aging capability.

FIG. 11 This is the analog system design of LDVR. (A) is the schematics of low noise, external-capacitor-free Low Drop Voltage Regulator (LDVR) for low frequency and high Giga Hz frequency range power supply and noise isolation; (B) is the schematics of the low noise, external-capacitor-free Low Drop Voltage Regulator (LDVR) for low frequency and Meg Hz frequency range power supply and noise isolation; (C) is the model of the idealized LDVR; (D) is the power noise and the smart sampling strategy for the switch capacitor noise filter; this is hierarchical circuit design with the digital/logic circuit embedded in the switch capacitor and analog circuit; it is not the analog circuit at all; (E) is the gain diagram of the conventional flat circuit design with the pure analog circuit of the LDVR with the external capacitor; (F) is the gain diagram of the hierarchical circuit design with the digital/logic and smart sampling switch capacitor embedded in the analog circuit of the LDVR as shown in FIG. 11A.

FIG. 12 (A) is the schematic of LC oscillator with the embedded LDVR mechanism having both current source and voltage source to have the quenching effect on the power and ground noise; (B) is the output oscillation of the conventional LCO; (C) is the logic/digital circuit can have the same embedded LDVR structure to supply the power and have the noise isolation; (D) is the simplified version of FIG. 12A having no voltage source.

FIG. 13 is the schematic of programmable LNA for the high frequency direct input of clock signal. (A) is the basic single end LNA having the programmable gain capability; (B) is the low noise differential end programmable gain LNA (PGLNA).

FIG. 14 is the schematic of programmable filtering mixer with the embedded LDVR mechanism having the quenching effect on the self-generated mixer noise.

FIG. 15 is the schematic of programmable output driver of buffer with the embedded LDVR mechanism having the quenching effect on the self-generated noise.

FIG. 16 (A) is the direct analog compensation for the L over temperature variation in the LC tank without the A/D and digital control, etc.; (B) is the principle of the direct analog compensation for the L in the LC tank over temperature variation.

FIG. 17 is the Design For Yield (DFY) applied to the chip design and production flow; (A) is the design phase and debug phase which have different conditions; (B) is the DFY to unify the design phase and debug phase.

FIG. 18 is the DFY simulation methodology; (A) is the ideal analog simulation with the solid power and ground; (B) is the real chip situation; (C) is the simulation for the real chip; (D) is the DFY PSRR (Power Supply Reject Ratio) AC test; (E) is the DFY stepwise transient test.

FIG. 19 is the DFY design flow for SOC (System On Chip).

FIG. 20 is the DFY chip platform; (A) is the idealized model of the DFY chip; (B) is implementation of the idealized DFY chip model; (C) is the MOS model; (D) is the DFY chip model which is conjugate to the MOS model; (E) is the system model with on-board LDVR; (F) is the system model with the on-chip model; (G) is the system model with the DFY platform.

FIG. 21 (A) is the DFY bandgap circuit design for the multiple power buses with the POS (Power-On-Sequence), POR (Power-On-Reset), offset voltage, etc problems; (B) the offset voltage of OPAMP causes the failure of the bandgap voltage circuit.

FIG. 22 is the DFY voltage reference generator; (A) is the static voltage reference; (B) is the DFY voltage reference circuit.

FIG. 23 is the DFY clock reference generator; (A) is the varactor used in the LCO tank; (B) is the dynamic clock reference for LCO tank; (C) is the DFY clock reference circuit; (D) is the common mode generator adopted in the common mode control loop adopted in

FIG. 23C; (E) is the peak detector adopted in the amplitude control loop adopted in

FIG. 23C; (F) is the DFY clock reference circuit with the temperature compensation capacitor for the inductor parametric resistance; (G) is the varactor characteristic curve; (H) is the natural oscillation frequency f_(o) of the temperature compensation capacitor LCO tank as shown in FIG. 23F.

FIG. 24 is the common mode specified LCO resonator; (A) is the DFY LCO having the specified common mode voltage mechanism; (B) is the LCO having the common mode voltage specified and the current sources having the feedback for constant amplitude; one current source is the current mirror of the current source which controls the constant amplitude of oscillation; (C) is the DFY LCO having the common mode voltage specified with two inductors being made of the transformer.

FIG. 25 (A) is the self-compensation DFY clock reference circuit; (B) is the idealized LCO tank; (B) is the self-compensation LCO tank; (D) is the general configuration of the self-compensation LCO tank.

DESCRIPTION AND OPERATION

FIG. 1 shows the XtalClkChip having the oscillator tank 1 without any external disturbance and the phase-lock loop 2 which can generate any frequency which is specified by the customers. The XtalClkChip adopts the most advanced hierarchical PVTAN (Process-Voltage-Temperature-Aging-Noise) design. In this design, we adopt the most advanced SOC IC circuit design techniques which haven't shown anywhere. Being similar to the layout having the floor plan before the place and routing, we have the noise plan and power plan before designing the individual circuit modules. Being similar to the digital circuit having the timing analysis and verification after the logic function design and verification, for the analog circuit design, we have the noise analysis and verification after the analog function design and verification. In the SOC IC design, we use the hierarchical circuit design which is the application of the hierarchical system control theory. Instead of using the centralized LDVR, we adopt the distributed LDVR to save power and make the good isolation of noise. Furthermore, we invent the bonding capacitor package techniques to attach the high-density high capacitance fringe capacitor to the top of the IC. It saves the pin and enhance the performance of the chip.

The design principle of the XtalClkChip is to adopt the divide-and-conquer methodology to divide the PVT (process-voltage-temperature) variation to be two orthogonal domains of the temperature compensation domain and the process compensation domain. For the voltage variance of the power supply and the noise of power and ground, we design the XtalClockChip with PSRR AC testing.

As shown in FIG. 2, it is the calibration and testing flow of the XtalClkChip. Referring to FIG. 1 and FIG. 2, the bandgap reference voltage V_(bg) 3 generates the V_(bg) of the chip. The process identifier 4 reads out the V_(bg) voltage can tell what kind process (SS, TT, FF, etc) of the XtalClkChip is, where S is slow process, T is typical process and F is the fast process.

After the process of the XtalClkChip is identified, the nonlinear coefficient table 5 is loaded into the XtalClockChip. The temperature sensor circuit 6 is to sense the temperature of the XtalClockChip. According to the temperature of the XtalClkChip, the proper nonlinear coefficient is selected and the value is sent to the DAC or digital control 7 to control the capacitor 8 of the oscillator tank 1 to generate the fixed oscillation frequency f_(o). Since the oscillation tank 1 has no external disturbance, so it is very stable in its output oscillation frequency f_(o).

No matter how, our XtalClkChip has much better quality and flexibility for the customer than the conventional dividing the oscillation tank oscillation frequency f_(o) down to 24 MHz then boost with customer's own PLL. The less signal processes to the final customer's clock, the better the signal quality is. From the whole system view, the XtalClkChip can generate the output directly for the customer, the clock performance will be much better than the divide the clock 1 GHz to be 24 MHz, and then the customer boosts the clock up with the PLLs to be the customer's clocks. In any case, no matter how, the PLL does need between the oscillator tank 1 and the customer clocks.

So, we have one on-chip fractional PLL 1 to convert the oscillation in GHz ranges to be the customer's specified clock. Adjusting the programmable variable m, n/n+1 and p, the f_(o) is divided to be the fractional value of f_(clk)=(n.f)*(f_(o)/m)/P where (n.f) means n digital with f fraction. As shown in FIG. 1, the output clock f_(clk) is compared with the customer's specified input CLK_(ref) and the parameters m and n are adjusted accordingly.

For the spread-spectrum clock, it is easily to programming the parameters of the multi-phase fractional PLL to have the cyclic spread-spectrum operation. For the multi-phase fractional PLL, the spread-spectrum clock is implemented with the parameters of PLL instead of the variance the LCO oscillation tank as the other's traditional clock chip does.

There is a bypass path of the PLL. If the customer just wants to read out the clock or the clock without the PLL, the MUX 10 can be selected to bypass the PLL to read out the f_(o) or f_(o)/m directly.

The XtalClkChip needs high precision LC tank and capacitor to decouple the noise in the LDVR, etc. However, as shown in FIG. 3A, in the traditional chip, they use the external capacitor and inductor or filter connected through the bonding wire 71, etc. The dotted line is the chip boundary. As shown in FIG. 3B, the parasitic inductor 17L of bonding wire 17, etc deteriorates all the performance. As shown in the FIG. 3C, in our XtalClkChip, we adopt the bonding fringing capacitor, on-chip capacitor and on-chip Bulk Acoustic Wave (BAW).

Since the customer might use the f_(clk) directly, so we provide the high quality output clock f_(clk). As shown in FIG. 3D, it is the top chip Bulk Acoustic Wave (BAW) device which can be integrated on the top of the silicon chip. The quality factor Q is 1,500 for the BAW device. The electrode 13 and 14 clamp a piezoelectric layer 11. The piezoelectric layer 11 is above an air gap. The piezoelectric layer 11, electrodes 13 and 14 are constituted of an MEM type inductor which can be integrated on the top of silicon isolator 15 and the silicon wafer 16.

As shown in FIG. 3E, the fringe capacitor 17 has the capacitor strip 17 f piled up to be 3D structure. The high-density capacitor modules can be bonded to the pad 18 directly to be the bonding capacitor. The high-density fringe strip fringing capacitor 17 can also bond to any position 18 p over the chip as shown in FIG. 3C.

FIG. 4 shows the detailed block diagram of the fractional PLL. To generate the fractional PLL clock, the divider is swapped between the n and n+1 modules having the multiple phases of fractional PLL. It has 0 degrees, 90 degrees, 180 degrees, 270 degrees multiple phases. There are two ways to generate the 4 phases of clock. One way is to use the single VCO to have the two different connections of the (/2) dividers. The other way is to use the I and Q dual VCOs to generate the 4 phases clock as shown in FIG. 9. The multiple phases combines with the n/n+1 modules division will generate much more smooth transition in the factorial PLL transition. So the phase noise is much smaller.

In the XtalClkChip design, we use the most advanced hierarchical circuit design for the NPVTA design process. FIG. 12 shows the circuit implementation of the LC tank. Combining the high Q=1500 BAW LC tank and the multi-phase factorial PLL, the XtalClkChip performance will be much higher than the traditional crystal clock circuit. Now, the XtalClkChip is not to emulate and try to catch the performance of the traditional crystal clock circuit. The XtalClkChip has the much superior performance to the traditional crystal circuit.

For the low performance XtalClkChip, the inductor can be replace with the gyrator and C as shown in FIG. 5A or the bonding wire as shown in FIG. 5B or nano-tube. FIG. 5C shows the LCO made of the inductors made of the bonding wires as shown in FIG. 5B.

As shown in FIG. 6 and FIG. 7, PTAT is Proportional To Absolute Temperature; CTAT is Conjugate To Absolute Temperature where (×l) and (×m) is the scaling factor of the bipolar devices in bandgap reference circuit. The bandgap voltage reference is V_(bg)=V_(ptat)+V_(ctat). The bandgap reference current is I_(bg)=k*(Iptat+Ictat). FIG. 6A is the circuit implementation of the graphic representation of the V_(bg) and I_(bg) in FIG. 7.

FIG. 6 shows the hierarchical circuit applied to the bandgap reference design. FIG. 6B shows the necessity of the partition of the bandgap reference circuit to be the hierarchical circuit. Due to the bandwidth limit of the OPAMP, the circuit is partitioned to be the global circuit and the local circuit. It is noted that the global level circuit is from the DC to the OPAMP bandwidth. The global circuit is served as the operating point of the higher frequency local circuit.

The OPAMP adopted the self-contained voltage regulator circuit configuration. It makes the bandgap has the high PSRR. The bias voltages V_(ptat) and V_(ctat) are for the global control region. The capacitors C_(ap), C_(oca) and C_(hi) are for the local region of Meg Hz region. The RC filter F_(p), F_(c) and F_(i) are for the local region of GHz range.

As shown in FIG. 6B, the OPAMP has the bandwidth limit. In the bandwidth of the OPAMP, the circuit is global control. Outside the bandwidth of the OPAMP, the bandgap reference circuit is in the mode of local control. As shown in FIG. 6C of AC analysis of the PSRR, the local region is further divided to be two local regions: the constant source region and the noise-filtering region. It is the hierarchical design applied to the noise design.

From the AC analysis of the PSRR (Power Supply Reject Ratio), the global region has the PSRR about −70 dB. It means that as the V_(CC) power supply varies from 2.9V to 3.7V, the V_(bg) is almost constant. It is the voltage variance in the PVTAN analysis. The higher the gain of the OPAMP is, the better PSRR in the global region is.

In the region of Mega Hz region which is outside the bandwidth of the OPAMP, we see the PSRR raises about −20 dB region. We need uses the local circuit C_(pa), C_(pi), C_(pc) and C_(ci) to keep the current source devices M_(pp), M_(pi), M_(pc) and M_(ci) to be constant current source to suppress the PSRR from −20 dB to −40 dB. It is the constant source region.

For the Giga Hz region, we need the local circuit F_(p), F_(c) and F_(i) to filter out the power supply noise. It is in the noise-filtering region.

In the derivation of the V_(bg) and I_(bg), it is assumed that the input nodes of the OPAMP have the same voltage. The less deviation of the OPAMP input nodes voltage differences are, the better the V_(bg) and I_(bg) are. It is the reason why the high gain OPAMP 30 is adopted. Both the PTAT and CTAT circuit have the same circuit configuration. However, the offset voltage of the OPAMP causes the deviation of the ideal case. So the autozero circuit devices M_(zp1), M_(zp2), M_(zp3) and M_(sp) are adopted to autozero the total offset voltage of the whole bandgap circuit which includes the input offset voltage of the OPAMP 30.

Furthermore, in the bandgap circuit, the resistance needs to be both temperature compensated and voltage compensated. To have the better control over the temperature variation and voltage variation, as shown in FIG. 8, the resistors are both voltage compensated and temperature compensated. The p-poly resistor has the positive coefficient over the temperature range. As the temperature increases, the p-poly resistance increases. The n-poly resistor has the negative coefficient over the temperature range. As the temperature increases, the n-poly resistance decreases. FIG. 8A shows the combined resistor has the weighting p-poly resistor and the weighting n-poly resistor has the temperature coefficient (TC) to be 0. This is the unit resistance which has the constant resistance over the temperature range.

FIG. 8B shows the circuit configuration of the voltage compensated resistor which is made of the unit resistors. All the unit resistors are connected in series and have the same amount current passing through all the unit resistors. So the voltage differences between two ends of the resistors are the same. So, the voltage is compensated for all the unit resistors. For the variable gain amplifier, the voltage-temperature-compensated unit resistor can eliminate the harmonic distortion of the signal. For the bandgap reference circuit, the voltage-temperature-compensated unit resistor can have much better constant reference voltage V_(bg) and reference current I_(bg).

Having the temperature and voltage compensated V_(bg), I_(bg) and resistors, etc, then we can use the V_(bg) and I_(bg) to generate the f_(o) from the oscillation tank 1. FIG. 12 shows the circuit implementation of the LC tank for the oscillation tank 1.

FIG. 9 shows the quality factor Q of the oscillator tank 1 can be increased with the IQ quadratic oscillator 8I and 8Q configuration. The LC oscillation tank is a filter. The oscillation of one tank 8I feeds the oscillation signal into the other oscillation tank 8Q and the oscillation signal is filtered by the other oscillation tank, and vice versa. The I and Q oscillation tanks mutually feed each other and mutually filtered by each other. This mutual-filtering process make the output oscillation signal has high Q.

FIG. 10 shows the dual oscillator circuit configuration can compensate for the aging of the oscillator tank. The oscillator 1 _(I) oscillates at frequency f₁. The oscillator 1 _(Q) oscillates at frequency f₂. The output frequency f_(o) of the filtering mixer me is (f₁−f₂). The filter can be either low-pass filter or bandpass filter. Furthermore, the bandpass filter can be integrated with the mixer itself. The bandpass type circuit implementation of the filtering mixer 1 _(mf) is shown as FIG. 14.

FIG. 11 shows the hierarchical circuit with noise design circuit applying to the LDVR (Low Drop Voltage Regulator). FIG. 11A is the LDVR without the need of the compensation of the external capacitor. In the conventional LDVR design, they used the flat circuit design. They never use the hierarchical circuit design in the noise design style circuit. It is extremely difficult for the flat circuit design with solid power and ground design style engineers to understand the circuit designed by the hierarchical circuit design with noise circuit design style.

The other people's LDVR are based on the flat concept. So they use a lot of effort to boost up the OPAMP frequency response to have the higher bandwidth. Our LDVR uses the hierarchical circuit design to have the global circuit and the local circuit. As shown in FIG. 11A and FIG. 11D, there are the switch capacitor filter S_(p) and C_(p) to sample (S), hold (H), filter and average the feedback voltage V_(fbp) and V_(fbn) in the quite periods. The filter is a series of small filters instead of a giant external capacitor connected to the output node V_(p). The filter F_(p) is to have much clean V_(fbp) and V_(fbn) signals. The switch capacitor can make the smart sample hold of the quite signal. The other flat circuit uses the giant external capacitor is equivalent to have the filter at the output node to filter the noise generated by the load. The hierarchical circuit uses much small smart switch capacitor to sample and hold the DC output voltage at the quite period. We use divide and conquer approach to divide the LDVR problem to be the global problem and the local problem. The global problem is to provide the constant current source to the output load. The local problem is to quench the noise generated by the output load. The local circuit is the NMOS device M_(n) to boost up the high frequency response.

The other flat circuit design engineers do not recognize the problem that the load will generate the violent noise. So the traditional flat circuit design applied to the LDVR design is completely wrong. The biggest gap is the concept gap. The hierarchical circuit design concept and the flat circuit design concept have a large concept gap.

The OPAMP A_(p) and A_(n) had better to be the folding cascade OPAMP. The dominant pole is at the output nodes V_(p) or V_(n). As shown in FIG. 11E, for the conventional flat circuit design of LDVR, they use two stage OPAMP, it definitely has the stability problem that they have to use the external cap and waste one single pin. Furthermore, they have to use the compensation capacitor. As shown in FIG. 11E, the role of the compensator is to move the 0 db point as shown by the arrows. As shown in FIG. 11F, the filter has the same effect as the compensation capacitor. The switch capacitor S_(p) and C_(p) not only can adjust for the resistance but also to sample the average at the quite time. With the smart use of the switch capacitor in the hierarchical circuit design, we can get rid of the external giant capacitor and have much superior performance. We use the hierarchical design with noise circuit design style. The filter chain has the same effect of the compensation capacitor.

Referring to FIG. 11A, the voltage source device M_(n) is biased at a constant voltage. If the output voltage V_(n) is higher than the supply voltage V_(cc), then the charging pump CHP circuit is needed. Except the charge pumping circuit CHP, the feedback loop control circuit has the similar circuit configuration as the current source device M_(p) feedback loop control circuit.

Furthermore, even though we illustrate the complete circuit here, the LDVR circuit for M_(p) and M_(n) can share the resource to share the same circuit to simplify the design.

The hierarchical circuit design divides the frequency domain to be three ranges and each range has its circuit. The three ranges circuits cooperate to work together. As shown in FIG. 11F, the solid thick line is the curve for the FIG. 11A; the dotted thick line is the curve for the combination for FIG. 11A and FIG. 11B. FIG. 11B is for the LDVR circuit working in the middle Meg Hz range.

As shown in FIG. 11A, there are the distributed LDVRs. FIG. 12A is the LCO (LC Oscillator) with the embedded distributed LDVR circuit structure. With the embedded distributed LVDR, all the RF modules can have only one common LDVR and distributed LDVRs as shown in FIG. 11A. This embedded LDVRs of the power plan and noise plan make the XtalClkChip to have the solid P&G (Power and Ground).

FIG. 12B shows the conventional LCO circuit having the ripple riding on the oscillation clock. This ripple is due to the current pulsing generated by the LCO flowing through the bonding wire L_(vcc) and L_(gnd). So, for noise style circuit design, we have to get rid of the ripple.

As shown in FIG. 12A, the LCO has the LC tank lies in the middle portion of the back-to-back connected latch style circuit. Instead of flows through the M_(p1), M_(p2), M_(n1) and M_(n2), the current and energy of the LC tank are cycling horizontally. Ideally, only the biasing current flows through the M_(p1), M_(p2), M_(n1) and M_(n2) to supply a small amount oscillation sustaining energy. So, the noise impact on the bonding wire L_(vcc) and L_(gnd) is minimized and the ripple noise generated by the L_(vcc) and L_(gnd) is minimized.

At the common nodes v_(com) and g_(com), there are the oscillation having the double frequency (2*f_(o)) and out of phase 180 degrees. This double frequency (×2 f_(o)) circuit is adopted this phenomena. However, the double frequency nodes voltage will feedback to the LCO and destroy the LCO performance. For the XtalClkChip, the LCO must have the idealized solid power and ground (P&G). The solid P&G is implemented with the embedded LDVR having the capacitor C_(onj) shorting the conjugating nodes v_(com) and g_(com). The oscillations at the conjugates nodes are 180 degrees out of phase and canceling each other.

However, no matter how large the capacitor Conj is, there are still has the ripples on the conjugate common nodes vcom and gcom. So we have the source follower devices M_(cvn) and M_(cvp) to move the double frequency (×2 f_(o)) oscillation to the compensation nodes v_(comp) and g_(comp). At the same time, the conjugate capacitor C_(onj) can be reduced to gm times to be small capacitor (C_(onj)/gm).

M_(cip) and M_(cin) are the current source type device. M_(cvn) and M_(cvp) are the voltage source type device. All the strong LCO tank oscillation is floating and circulating in the middle of the negative feedback mechanism.

As shown in FIG. 12C, the LCO tank is replaced with the digital logic circuit. The digital circuit shares the same distributed LDVR as LCO tank does. So the LCO and digital circuit have the mechanism is similar to the nuclear core of the artificial sun. The noise generated by the LCO and digital circuit are isolated from each other. This is the power plan and noise plan for the RF SOC design in the XtalClkChip. The clamping devices M_(cvn) and M_(cvp) are to isolate the noise from the LCO. However, they need have bias circuit. They can save to simplify the circuit. FIG. 12D is the simplified version of FIG. 12A. The clamping devices voltage source M_(cvn) and M_(cvp) are saved without much impact on the performance to simplify the circuit complexity.

Since the XtalClkChip may have the high frequency clock direct interface, so the XtalClkChip have the programmable LNA (PLNA) as shown in FIG. 13. FIG. 13A is the basic single end circuit configuration of LNA. FIG. 13B is the hierarchical design noise style for differential end PGLNA design. The circuit configuration is to have the output active inductor load lying horizontally. The current and energy are circulating horizontally in the circuit instead of the vertically pumping on the power supply and ground. It reduces the chip noises.

As shown in FIG. 13A, for the impedance matching, the PLNA must have the constant impedance. So the current flows through the input device M_(li) must keep constant. We can adjust the current flowing through the load L_(n) to adjust gain of PLNA. The switch S_(l), S_(n) are the programmable switch to adjust the DC current injecting into the M_(li). The more DC current injecting into M_(li), the less gain of PLNA will be.

As shown in FIG. 14 is the filtering mixer which combines the mixer and filter function together. It saves the energy, layout area and reducing the noise. The input signal V_(ilp) and V_(iln) oscillate at frequency f₁. The input signal oscillates at frequency f₂. The LC tank oscillates at the f₁−f₂. So, in FIG. 14, the bottom portion is the traditional mixer, the upper portion is the LCO oscillator serving as the filter. As f₁ signal mixes with f₂ signal, two different frequencies signals will generate. The LCO filter will filter out the (f₁+f₂) signal and amplifying the (f₁−f₂) signal only.

FIG. 15 shows the power amplifier or the on-chip buffer having the LC tank energy circulating horizontally. The bottom is a differential input. The upper portion is the LC oscillator tank. We use the LC tank to pull and push the heavy out load. In this circuit configuration, the driving energy just circulates around and reusable. The energy doesn't flow into the ground and impact on the ground to make giant noise. It saves a lot of energy and reduces a lot of noise.

FIG. 16 shows the direct analog temperature compensation for the LC tank as shown in FIG. 1. Instead of going through the A/D, table, DAC or digital control path, the temperature sensor circuit makes the temperature compensation directly as the analog signal processor. FIG. 16B shows the principle of the temperature compensation. FIG. 16A is the implementation of the temperature compensation circuit. The inductor varies as the temperature changes. The temperature sensor circuit senses the variance of the temperature and varies the V_(ctrl) signal to vary the capacitance. The variance of inductance is compensated with the variance of capacitance to have the output clock frequency f_(o) to be constant. The gain of the variance of capacitance can be adjusted with the variance of R.

As show in FIG. 17A, today analog design is based on the solid power and ground bus to calculate the operating point (OP) and do AC analysis at this operating point. However, in the real chip case, there are a lot of noises on the power bus and ground bus. The process, voltage, temperature (PVT) variation causes the CMOS devices of the analog circuit having the out of saturation mal-function cases. The power-on-sequence (POS), power-on-reset (POR) and power-down to save energy, all the processes are the dynamic transient process. The circuit might be locked in the dead zone state and the circuit cannot reach the normal operating point. It causes the yield problem. This is one of the failure modes in the debug phase. As shown in FIG. 17B, the design for yield (DFY) is to consider both the design phase performance issue and debug phase failure issues to be a unified design platform.

FIG. 18 shows the evolution of the DFY design methodology. Today analog design still adopts the solid power and ground buses as shown in FIG. 18A. In the real chip, the chip has the bonding wires for the power buses. There are oscillation on the power bus and ground bus as shown in FIG. 18B. To simplify the analysis and simulation, the ground node is moved from the negative pole as shown in FIG. 18B to the pin of the ground bus as shown in FIG. 18C. Now the ground bus is static zero having no oscillation. However, the power bus has almost double the oscillation amplitude. The relative power bus oscillation is V_(cc2)=V_(cc1)−V_(ss1). The oscillation of V_(ss1) is 180 degrees out phase of V_(cc1) and the amplitude of V_(ss1) is about the same order of V_(cc1). So the amplitude of V_(cc2) is about twice of V_(cc1). With the wave being shown in FIG. 18C, so the AC analytic model of the DFY is shown in FIG. 18D and the transient analytic model of the DFY is shown in FIG. 18E. The ΔV is about 200 mV.

The DFY design flow is shown in FIG. 19. The system integration engineer needs to develop the SOC infrastructure to prevent the digital noise from leaking out to the board to pass the whole-board performance verification test. In the analog/mixed signal/RF design, we not only design for the AC at OP, but also design for the PSRR and ΔV.

The DFY has one platform for the SOC chip. The idealized DFY platform is shown as FIG. 20A. There are two layers for the power and ground bus to isolate noise. From the outside V_(cc) and G_(nd) to see the upper power layer and the bottom ground layer, going through the bonding wire, there are idealized current source I_(src). From the inside of the internal circuit to see the upper power layer and the bottom ground layer, there is an idealized voltage source V_(src). As shown in FIG. 20, the idealized MOS device is modeled as voltage source V_(GS) in and idealized current source IDS out. As shown in FIG. 20D, the ideal DFY chip model is modeled as idealized current source I_(VCC) in and idealized voltage source V_(PWR) out.

The idealized DFY platform is implemented as FIG. 20B. The M_(cip) and M_(cin) devices serve as the idealized current source I_(src). The M_(cvn) and M_(cvp) devices serve as the idealized voltage source V_(src). The capacitor C_(pi) and C_(ni) serve both compensation capacitor and the power and ground buses noises reducing capacitor. The capacitor ratio between C_(pi) and M_(cip) is about 100:1. The capacitor ratio between C_(ni) and M_(cin) is about 100:1. The M_(uvp) and M_(bvp) devices are the active clamping devices for the idealized voltage source V_(src). C_(pg) is equivalent to the voltage clamping capacitor between the power and ground source.

The DFY chip platform is implemented with the on-chip low drop voltage regulator (LDVR). The on-board LDVR is shown as FIG. 20E. The LDVR on board cannot get rid of the chip noise. To get rid of the chip noise generated by the bonding wires, the on-chip LDVR is adopted as shown in FIG. 20F. The on-chip LDVR can be modeled to be idealized DFY platform as shown in FIG. 20G. For the distributed LDVR, the biasing current generator is moved from analog circuit to LDVR and combining with the LDFR.

The DFY platform needs the LDVR. For PVT (process, voltage, temperature variance independent) design process, LDVR needs the bandgap voltage V_(bg). For the multiple power buses DFY platform, the bandgap voltage generator is shown as FIG. 21A. The bandgap voltage generator in the SOC has the multiple power buses effect. It must survive in the POS (power-on-sequence), POR (power-on-reset), PDN (power-down), and etc versatile start-up environment. Even worse, as shown in FIG. 21B, the offset voltage V_(os) easily fails the bandgap voltage with 30 mV offset. How to design a reliable bandgap voltage reference generator becomes the challenging work. As shown in FIG. 21A, the power bus V_(dd) and V_(cc) can have any power on sequence. The power down signal PDN and PDNB have different POS relations with the V_(cc) and the bandgap voltage generator. As the V_(cc) starts earlier, the bandgap voltage is locked in the dead zone due to the minor V_(os), says +2 mV. The bandgap voltage generator cannot be kicked to start with the traditional pulling down V_(ptat) voltage. So, we have the POR circuit to inject the start pulsing current I_(inj) directly into the bandgap mechanism made of R₁, R₂, R₃, Q_(l and Q) _(m). Furthermore, to reduce the impact of V_(os), R₃<R₂.

For SOC having both analog and digital circuit, we need to convert the analog signal to be the digital signal with ADC. The ADC must have two accurate references: reference voltage V_(refp), V_(refn) and clock reference. As shown in FIG. 22A is the static reference voltage. As shown in FIG. 23B is the dynamic reference. These references are derived from the bandgap reference.

As shown in FIG. 22A, for the reference voltage generator,

V _(refp) =V _(cm) +I _(ref) ×R _(u)

V _(refn) =V _(cm) −I _(ref) ×R _(L)

V _(ap) =V _(refp) −V _(cm) =V _(cm) −V _(refn) =V _(an)

-   -   Where R_(u)=R_(L).

The V_(cm) is usually selected to be the middle point of the power supply voltage, i.e., V_(cm)=(½)V_(cc). As shown in FIG. 22B, the voltage reference generator is to generate the voltage reference according to the above relation. The I_(ref) generator generates the I_(ref) from the bandgap voltage V_(bg). The I_(ref) generator generates the control-biasing signal to the current source device M_(bg). The V_(cm) generator generates V_(ref)=(½)V_(cc) from V_(cc) and adjust the V_(cm)=V_(ref)=(½)V_(cc). The V_(cm) generator generates the control-biasing signal to the current source device M_(ug). The V_(cm) generator adjust the current source device Mug to have the voltage V_(cm)=V_(ref), the I_(ref) generator is to adjust the voltages to have the specified voltage ranges V_(ap) and V_(an). This is a static case. FIG. 23 shows the same circuit topology applying to the dynamic case of the clock generator.

As shown in FIG. 23C is the LC resonator of the clock generator. The oscillation frequency is determined by the square root of (1/LC). To adjust the oscillation frequency, the V_(ctrl) is applied to bias the varactor to change the capacitance of the varactor. The capacitance of the varactor is varying due to the voltage difference across the varactor. However, as shown in FIG. 23A and FIG. 23B, this is a dynamic process. The capacitance of the varactor is a nonlinear function of the voltage difference crossing the varactor. Even V_(cmo) and V_(ctrl) keep the same, varying the oscillation amplitude V_(apo) and V_(ano), the capacitance of varactor is varying. It causes the oscillation frequency shifts accordingly. So, we need make control of both the oscillation common mode voltage level V_(cmo) and the oscillation amplitude V_(apo) and V_(ano) to be the specified design value. Being similar to FIG. 22, we apply the V_(cin) control signal to the current device M_(cin) to control the oscillation amplitude V_(apo) and V_(ano). We apply the V_(cip) signal to the current device M_(cip) to control the common mode voltage V_(cmo). This is the dynamic case.

As shown in FIG. 23C, the V_(ref,cmo) generator generates a V_(refcmo). As shown in FIG. 23D, the V_(cmo) detector detects the V_(cmo). The V_(cmo) Generator compares the V_(cmo) and V_(refcmo) and applies the V_(cip) signal to adjust the common V_(cmo) level of V_(o+) and V_(o−). The V_(ref,apo) generator generates the reference peak voltage V_(refapo). As shown in FIG. 23E, the V_(apo) detector detects the peak amplitude voltage of the V_(o+). The V_(apo) generator compares the V_(refapo) with V_(apo) and applies the biasing signal V_(cin) to control the current device M_(cin) to adjust the amplitude of V_(o+) and V_(o−). Furthermore, the V_(apo) generator has the kick to start function. At the starting point, the oscillation amplitude V_(o+) and V_(o−) is small. The V_(apo) generator will inject a large current into the LCO oscillation tank to kick the LCO oscillator to oscillate.

It is noted that the V_(cmo) in FIG. 23D connected to be the V_(ref) in FIG. 23B, then the V_(refp) becomes the voltage V_(refapo) in FIG. 23C. In other words, the V_(refapo) Gen in FIG. 23C can be implemented with the V_(ref) Generator circuit with proper modifications. The R_(adj) and R_(u) have the temperature compensation with each other. So, the V_(refp) and V_(refapo) are constant over temperature.

However, the inductor has the parametric resistance R_(L). The resistance R_(L) varies according to temperature. So, it needs the temperature compensation array to adjust the capacitor value to adapt the variance of the frequency due to the variance of the parametric inductor resistance as shown in FIG. 23F. However, due to the nonlinearity of the varactor as shown in FIG. 23G, the best compensation result for the temperature compensation capacitor array methodology is the “smiling curve” as shown in FIG. 23H. So, we have the other resistor-resistor compensation as shown in FIG. 25A. It is not only to save the complexity of the chip to reduce the price of the chip but also to enhance the performance.

The V_(cmo) can be injected into the LCO tank to specify the common mode voltage V_(cmo) to be specified voltage. Level. As shown in FIG. 24, the inductor is separated to be two equal inductors L₁ and L₂. An analog buffer B_(a) is adopted to specify the middle voltage V_(co) to be V_(cmo). The analog buffer can be a unit gains OPAMP. So, we need only have the V_(apo) generator to control the current device M_(cip) to adjust the amplitude of the oscillation.

It is noted that the common mode voltage injecting method can only applied to the LCO case as shown in FIG. 24, The common mode voltage injecting method cannot be applied to the V_(ref) generator case as shown in FIG. 22.

To compensate the frequency variance, the smart way is adopted as shown in FIG. 25A. There are compensating resistances R_(C) being added in series with the capacitor of varactor. The compensate resistance R_(C) is equal to the parametric resistance R_(L). The compensation resistance R_(C) working principles are derived as follows.

As shown in FIG. 25B,

${Y\left( {j\; \omega} \right)} = {\frac{1}{j\; \omega \; L} + {j\; \omega \; C}}$ d(Y(j ω))/d(j ω) = 0 ${\frac{1}{{- \omega^{2}}L} + C} = {{0\omega_{0}} = \sqrt{\frac{1}{LC}}}$

As shown in FIG. 25C,

${Y\left( {j\; \omega} \right)} = {\frac{1}{{j\; \omega \; L} + R_{L}} + \frac{1}{\frac{1}{j\; \omega \; C} + R_{C}}}$ d(Y(j ω))/d(j ω) = 0 $\omega = {{\omega_{0}\frac{{{j\omega}\; L} + R_{L}}{\frac{1}{j\; \omega \; C} + R_{C}}} \cong {\omega_{0}\frac{{j\sqrt{\frac{L}{C}}} + R_{L}}{{j\sqrt{\frac{L}{C}}} + R_{C}}}}$ If  R_(C) = R_(L) ω ≅ ω₀

As shown in FIG. 23F, to compensate the variance of the oscillation frequency of the LCO induced by the parametric resistance R_(L) of inductor, the temperature compensation circuit is needed to fine-tune the capacitance of the second varactor. It wastes a lot of the chip resource.

As shown in FIG. 25B, applying the relation of d(Y(jω))/d(jω)=0, the ideal LCO tank with no resistance has the oscillation frequency to be ω_(o) to be square root of (1/LC). As shown in FIG. 25C, we use the temperature variance of resistance to compensate the temperature variance of resistance. The frequency variance induced by the parametric resistance R_(L) is small, the variance of oscillation frequency is small. So we can apply the approximation to simplify the derivation in the second order relation. Finally, we get, for the first order compensation, as long as R_(C)=R_(L), the ω can be keep constant ω_(o). FIG. 25D is the general configuration of the LCO tank. The same argument and conclusion made in FIG. 25C can be extended to the general configuration of the LCO tank as shown in FIG. 25D.

As shown in FIG. 24B, there is a current mirror version of the current sources. In such case the injecting current of V_(cmo) injecting into the V_(co) node is almost zero. In the enhanced version of the LCO tank will save a lot of power.

As shown in 24C, there are transformer type inductors T₀₁ and T₀₂. In such transformer type inductors, we increase the symmetry of the LCO tank. For such transformer type inductor, the amplitude and common mode center of V_(o+) and V_(o−) will be almost the same.

FIG. 25 is the self-compensation DFY clock reference circuit which is improved over the temperature compensation capacitor as shown in FIG. 23F. The temperature compensation capacitor as shown in FIG. 23F is no more need in the self-compensation DFY clock reference circuit as shown in FIG. 25.

While the invention has been particularly shown and described with reference to the preferred embodiments thereof, it will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the spirit and scope of the invention. 

1. A DFY circuit having XtalChip means, said XtalChip means containing a LCO means and current source means, said LCO means containing inductor means, capacitor means, varactor means, voltage control means, and inverter means, said inductor means, capacitor means and varactor means connecting in parallel to be an LC oscillation tank means, said LC oscillation tank means being connected between an input of said inverter means and an output of said inverter means, said current source means supplying current to said LCO means, between said current source means having glitch eliminating capacitor means to filter out glitches generated by said LCO means.
 2. A DFY circuit according to claim 1 further comprising an oscillation amplitude controlling means, said oscillation amplitude controlling means connecting to said LC oscillation tank means and detecting oscillation amplitude of said LC oscillation tank means, said oscillation amplitude controlling means feedback said oscillation amplitude to said current source means to keep said oscillation amplitude of said LC oscillation tank means to have constant amplitude oscillation.
 3. A DFY circuit according to claim 1 further comprising an oscillation common mode voltage controlling means, said oscillation common mode controlling means connecting to said LC oscillation tank means and detecting common mode voltage of said LC oscillation tank means, said oscillation common mode controlling means feedback said common mode voltage to said current source means to keep said common mode voltage of said LC oscillation tank means to have constant common mode voltage.
 4. A DFY circuit according to claim 1 further comprising an oscillation amplitude controlling means and common mode voltage controlling means, said oscillation amplitude controlling means connecting to said LC oscillation tank means and detecting oscillation amplitude of said LC oscillation tank means, said oscillation amplitude controlling means feedback said oscillation amplitude to a first said current source means to keep said oscillation amplitude of said LC oscillation tank means to have constant amplitude oscillation; said oscillation common mode controlling means connecting to said LC oscillation tank means and detecting common mode voltage of said LC oscillation tank means, said oscillation amplitude controlling means feedback said common mode voltage to a second said current source means to keep said common mode voltage of said LC oscillation tank means to be constant common mode voltage.
 5. A DFY circuit according to claim 1 further comprising oscillation frequency temperature compensation means, said oscillation frequency temperature compensation means sensing temperature and adjusting capacitance of varactor to fine tune oscillation frequency of said LC oscillation tank means to be constant over variation of temperature.
 6. A DFY circuit according to claim 1 of which said inductor means having parametric resistance, said capacitor means and varactor means having a temperature compensating resistance in series connection, said temperature compensating resistance compensating said parametric resistance to keep oscillation frequency of said LC tank being constant over variation of temperature.
 7. A DFY circuit having XtalChip means, said XtalChip means containing a LCO means and current source means, said LCO means containing inductor means, capacitor means, varactor means, voltage control means, inverter means, said inductor means, capacitor means and varactor means connecting in parallel to be an LC oscillation tank means, said LC oscillation tank means being connected between an input of said inverter means and an output of said inverter means, said current source means supplying current to said inverter means; said inductor means having parametric resistance, said capacitor means and varactor means having a temperature compensating resistance in series connection, said temperature compensating resistance compensating said parametric resistance to keep oscillation frequency of said LC tank being constant over variation of temperature.
 8. A DFY circuit according to claim 7 further comprising an oscillation amplitude controlling means, said oscillation amplitude controlling means connecting to said LC oscillation tank means and detecting oscillation amplitude of said LC oscillation tank means, said oscillation amplitude controlling means feedback said oscillation amplitude to said current source means to keep said oscillation amplitude of said LC oscillation tank means to be constant amplitude.
 9. A DFY circuit according to claim 7 further comprising an oscillation common mode voltage controlling means, said oscillation amplitude controlling means connecting to said LC oscillation tank means and detecting common mode voltage of said LC oscillation tank means, said oscillation amplitude controlling means feedback said common mode voltage to said current source means to keep said common mode voltage of said LC oscillation tank means to be constant common mode voltage.
 10. A DFY circuit according to claim 7 further comprising an oscillation amplitude controlling means and common mode voltage controlling means, said oscillation amplitude controlling means connecting to said LC oscillation tank means and detecting oscillation amplitude of said LC oscillation tank means, said oscillation amplitude controlling means feedback said oscillation amplitude to a first said current source means to keep said oscillation amplitude of said LC oscillation tank means to be constant amplitude; said common mode voltage controlling means connecting to said LC oscillation tank means and detecting common mode voltage of said LC oscillation tank means, said common mode voltage controlling means feedback said common mode voltage to a second said current source means to keep said common mode voltage of said LC oscillation tank means to be constant common mode voltage.
 11. A DFY circuit according to claim 1 further comprising voltage source means, said voltage means been connected between said LCO means and current source means, said voltage source supplying constant voltage to said LCO means and isolating said LCO means from LCO generated glitch and push away said glitch to said glitch-eliminating capacitor means.
 12. A DFY circuit according to claim 7 further comprising voltage source means, said voltage means been connected between said LCO means and current source means, said voltage source supplying constant voltage to said LCO means and isolating said LCO means from LCO generated glitch and push away said glitch.
 13. A DFY circuit according to claim 1 further comprising a bandgap voltage generator means, said bandgap voltage generator comprising resistors and diode means, said resistor means having different ratio to reduce offset voltage effect impacting on bandgap voltage.
 14. A DFY circuit according to claim 13, said bandgap voltage generator further comprising a power down control means and POR means, said power down means supplying power to said POR means, as power up, said POR means injecting current to said bandgap voltage generator to kick said bandgap voltage generator out of dead zone state.
 15. A DFY circuit according to claim 1 further comprising reference voltage generator means, said reference voltage generator having bandgap voltage dividing by a resistor to generate reference current; said reference current flowing through other resistor to generate reference voltage; said reference voltage having temperature compensation between resistors that said reference voltage being temperature independent.
 16. A DFY circuit according to claim 2 of which oscillation amplitude controlling means further comprising a reference voltage generator and a common mode voltage generator, said common mode voltage generator setting common mode voltage and set reference voltage generator generating reference voltage having difference of said reference voltage and said common mode voltage to be constant.
 17. A DFY circuit according to claim 1 further comprising oscillation amplitude controlling means and common mode voltage specified means, said inductor of said LC oscillation tank being constituted of two inductors, said oscillation common mode specified means connecting to a node between said two inductors and specified said node voltage to be a specified common voltage. said oscillation amplitude controlling means connecting to said LC oscillation tank means and detecting oscillation amplitude of said LC oscillation tank means, said oscillation amplitude controlling means feedback said oscillation amplitude to said current source means to keep said oscillation amplitude of said LC oscillation tank means to be constant amplitude.
 18. A DFY circuit according to claim 7 further comprising oscillation amplitude controlling means and common mode voltage specified means, said inductor of said LC oscillation tank being constituted of two inductors, said oscillation common mode specified means connecting to a node between said two inductors and specified said node voltage to be a specified common voltage. said oscillation amplitude controlling means connecting to said LC oscillation tank means and detecting oscillation amplitude of said LC oscillation tank means, said oscillation amplitude controlling means feedback said oscillation amplitude to said current source means to keep said oscillation amplitude of said LC oscillation tank means to be constant amplitude.
 19. A DFY circuit according to claim 18 of said current source having current mirror structure such that said current sources having the same current and said common mode voltage specified means doesn't inject current into said LC oscillation tank to save power.
 20. A DFY circuit according to claim 18 of said inductors being transformer type inductors. 